3D IC Integration and Packaging

by John H. Lau

2021-02-02 03:43:56

Publisher''s Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality,  authenticity, or access to any online entitlements included with the product.A comprehensive guide to 3D IC integration and pack... Read more

Publisher''s Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality,  authenticity, or access to any online entitlements included with the product.




A comprehensive guide to 3D IC integration and packaging technology


3D IC Integration and Packaging fully explains the latest microelectronics techniques for increasing chip density and maximizing performance while reducing power consumption. Based on a course developed by its author, this practical guide offers real-world problem-solving methods and teaches the trade-offs inherent in making system-level decisions. Explore key enabling technologies such as TSV, thin-wafer strength measurement and handling, microsolder bumping, redistribution layers, interposers, wafer-to-wafer bonding, chip-to-wafer bonding, 3D IC and MEMS, LED, and complementary metal-oxide semiconductor image sensors integration. Assembly, thermal management, and reliability are covered in complete detail.


3D IC Integration and Packaging covers:


3D integration for semiconductor IC packaging
Through-silicon vias modeling and testing
Stress sensors for thin-wafer handling and strength measurement
Package substrate technologies
Microbump fabrication, assembly, and reliability
3D Si integration
2.5D/3D IC integration
3D IC integration with passive interposer
Thermal management of 2.5D/3D IC integration
Embedded 3D hybrid integration
3D LED and IC integration
3D MEMS and IC integration
3D CMOS image sensors and IC integration
PoP, chip-to-chip interconnects, and embedded fan-out WLP
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Book Details

ISBN9780071848060
Author
SPECIALIZED PROFESSIONAL COMPETENCEDesign, analysis, materials, process, manufacturing, qualification, reliability, testing, and thermal management of electronic and optoelectronic components and syst...

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